Basic Information
Abstract Number: 110-8    
Author Name: Luc Dionne Affiliation: PerkinElmer Inc.
Session Title: Atomic Spectroscopy: Fundamentals, ICP-MS, Glow Discharge
Event Type: Oral
Event Title: Extending Dynamic Range Capability for Inductively Coupled Plasma Mass Spectrometry (ICP-MS) in Specific Market Segments
Presider(s): Dorman, Frank Start Time: 03:35 PM ( Slot # 9 )
Date: Sunday, March 8th, 2009 Location: S405a
Keywords: Environmental, Food Science, Geochemistry, ICP-MS

Co-Authors
NameAffiliation
Bosnak, CynthiaPerkinElmer Inc.
Pruszkowski, EwaPerkinElmer Inc.

Abstract Content
This presentation will focus on the selective signal attenuation capability of an Inductively Coupled Plasma Mass Spectrometer (ICP-MS) fitted with a second active quadrupole to provide Extended Dynamic Range (EDR) capability.

The determination of low and high concentration elements levels in complex sample matrices has always been a difficult analytical challenge. Inductively Coupled Plasma Optical Emission Spectrometry (ICP-OES) with Dual View capability has excellent matrix tolerance, good detection limits and several analytical and financial attributes. As such this technique lends itself well for this type of analysis. But in some instances the low trace level content required to be measured surpasses the analytical capability of this technique. For this reason end users have migrated to ICP-MS. The inherent sensitivity of this technique allows for very low concentration levels to be determined accurately. Yet one of the limitations of ICP-MS is well known; high concentrated elements levels traditionally observed in certain samples cannot be measured due to a large degree because of detector saturation. To compensate for this limitation a conventional physical dilution is performed.

Case studies will be discussed highlighting the advantages of this unique and powerful detuning ICP-MS capability in the analysis of sample specimens covering the environmental, food and geochemical markets. Coupled with an efficient sample introduction system design and high matrix tolerant interface this improved and unmatched extended dynamic range tool easily and practically will allow the analysis of almost all sample matrix types.