Short Course - Introduction to ICP-MS

Course Information

Course Title:	Introduction to ICP-MS
Categories:	1 - Atomic Spectrometry 2 - Atomic Spectroscopy 3 - Mass Spectrometry 4 - Inductively Coupled Plasma
Instructor(s):	Robert Houk	Course Number:	13
Affiliation:	Ames Lab USDOE
Course Date:	03/11/2012 - Sunday	Course Length:	1/2 Day Course
Start Time:	08:30 AM	End Time:	12:30 PM
Fee:	$235 ($335 after 2/13/12)	Textbook Fee:

Course Description

This course emphasizes the following: a) the fundamental principles by which the various components of ICP-MS devices function, b) the basic capabilities and limitations of ICP-MS, and c) how these principles influence design of effective tactics for analytical applications. The course has been updated to include several recent commercial instruments. In general, this course describes fundamental principles in more detail than training courses offered by ICP-MS suppliers; the latter mainly cover how to use the software and how to do routine maintenance of particular components.

Target Audience

ICP-MS users at all levels, especially beginners. This includes scientists from the various application areas, who often have not had courses like instrumental analysis.

Course Outline

General analytical capabilities of ICP-MS ICP as ion source, sample preparation & sample introduction, ion extraction, transmission & focusing, mass analysis- quadrupole, magnetic sector , matrix effects, applications survey, removal of polyatomic ions – high resolution, desolvation, cool plasma, collision cells

Course Instructor's Biography

R. S. Houk was born in New Castle PA and received the B. S. degree in Secondary Education from Slippery Rock State College in 1974. He received the Ph.D. in Analytical Chemistry from Iowa State University in 1980, where he worked with V. A. Fassel and H. J. Svec. He has been on the faculty at Iowa State University since 1981 and has a concurrent appointment in the Ames Laboratory of the U. S. Dept. of Energy. His long term interests are in inorganic analysis by mass spectrometry, particularly ICP-MS, electrospray MS, and the combination of these methods with chromatographic and electrophoretic separations for measuring elemental speciation. Houk built the first ICP-MS device and has won the following awards: ACS Award in Chemical Instrumentation (1993) and the Lester W. Strock Award (Society for Applied Spectroscopy, 1986), Hasler Award (Soc. for Analytical Chemistry of Pittsburgh & Fisons, 1993), Wilkinson Teaching Award (Iowa State, 1993), the Research Excellence Award from the College of Liberal Arts and Sciences (Iowa State, 2000), the Anachem Award (ACS Detroit Section, 2000), the Innolec Lectureship from Masaryk University (Brno, Czech Republic, 2006), and the Margaret White Graduate Faculty Award (Iowa State, 2007). He has also been named a fellow of the Society for Applied Spectroscopy (2007). Houk has published 160 papers and has served on the editorial boards of the Journal of Analytical Atomic Spectrometry and Spectrochimica Acta Part B, the two major journals in atomic spectroscopy.