Basic Information

Abstract Number: 1320 - 3
Author Name: Lin Li Chandler - BaySpec, Inc.
Session Title: New and Emerging Analytical Technologies in Forensic Science
Event Type: Symposia
Event Title: Novel 1064nm Dispersive Raman Spectrometer and Raman Microscope for Forensic Analysis

Presider Name:Ruth SmithCo-Author:William Yang, Eric Bergles
Affiliation:Michigan State UniversityAffiliation:BaySpec, Inc.

Date: Tuesday, March 19, 2013
Start Time: 02:40 PM (Slot #3)
Location: 118C

Abstract Content

Forensic examination of potential evidence often demands versatile analytical techniques with high specificity, high accuracy, and direct measurement ideally with little sample preparation, non-destructive and non-contact. Raman proves to be by far the most suitable analytical tool that can satisfy these essential criteria for forensic analysis. Coupled with microscope, it is capable of identifying trace forensic evidence in micro scale with chemical specificity.

With the advances in diode lasers and fast detectors, Raman technique has been improved dramatically with the easiness of operation, fast speed, and less cost which led its wide spread use in many applications from material identification, process control, nanomaterial research, to biological studies. However, high fluorescence background encountered in complex samples has limited the use of Raman technique in the forensic analysis. FT-Raman has been the only solution to suppress the fluorescence interference. But it is relatively cumbersome to use with constant moving parts and long acquisition time. This paper will introduce a new class of 1064 dispersive Raman spectrometer with highly efficient patented VPG grating, fast optics, and deep cooled InGaAs detector. The unique three wavelength confocal Raman microscope (532, 785, and 1064) will be highlighted. Without any moving parts, these compact 1064 Raman spectrometers feature high sensitivity, high spectral resolution, and stability. Ultimately, 1064 Dispersive Raman is the solution for the most complex forensic analysis especially when high fluorescence often obscure Raman signal.

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