ABSTRACT

Basic Information

Abstract Number: 2280 - 3
Author Name: Stacey J Smith - Brigham Young University
Session Title: Advanced Surface and Material Analysis by LEIS, XRD, Synchrotron Radiation, XPS, and ToF-SIMS, Individually and Combined
Event Type: Symposia
Event Title: The Vast Capabilities of X-Ray Diffraction and Scattering in Material Analysis

Presider Name:Matthew R Linford
Affiliation:Brigham Young University

Date: Thursday, March 12, 2015
Start Time: 09:10 AM (Slot #3)
Location: 242

Abstract Content

X-ray diffraction (XRD) is a powerful technique for characterizing crystalline materials. For polycrystalline materials such as powders, metal foils, sintered samples, finished parts, coatings and films, XRD can be used not only to quickly identify a material but also to quantify its phase composition, unit cell parameters, crystallite size, microstrain, and texture. Many of these properties can be studied in situ as a function of temperature. XRD can also be made surface sensitive using grazing incidence diffraction, which enables depth profiling of distances on the order of nanometers. Performing diffraction in the plane of the sample allows those crystal planes perpendicular to the surface to be characterized.

For films and materials that are not necessarily crystalline, X-ray scattering techniques can provide useful information. X-ray reflectivity (XRR) for example can be used to determine the thickness, density, and roughness of each layer present in any film. Small angle X-ray scattering (SAXS) can be used to characterize the average size and shape of nanoparticles or macromolecules in a matrix (liquid or solid) as well as the average pore size or other meso- or nano- characteristic distances present in partially ordered systems. After a brief overview of these techniques, a few specific examples will illustrate the wide range of materials for which X-ray diffraction and scattering can be useful.