Basic Information

Abstract Number: 2280 - 7
Author Name: Matthew R Linford - Brigham Young University
Session Title: Advanced Surface and Material Analysis by LEIS, XRD, Synchrotron Radiation, XPS, and ToF-SIMS, Individually and Combined
Event Type: Symposia
Event Title: Analysis of New Materials for Chromatography and Data Storage via Multiple Surface/Material Analytical Techniques

Presider Name:Matthew R Linford
Affiliation:Brigham Young University

Date: Thursday, March 12, 2015
Start Time: 11:10 AM (Slot #7)
Location: 242

Abstract Content

We have recently reported a series of new materials for liquid chromatography and for digital data storage. Our latest materials for liquid chromatography consist of carbon nanotube templated thin layer chromatography plates, and our new materials for digital data storage consist of nanofuses that can serve as memory elements. A variety of techniques have been applied to the characterization of these new materials. For example, X-ray photoelectron spectroscopy (XPS) has provided surface elemental analysis and oxidation state information about our new materials. Time-of-flight secondary ion mass spectrometry (ToF-SIMS) has been used to complement the information obtained by XPS, providing additional chemical information about the surfaces of our materials. ToF-SIMS is a form of surface mass spectrometry. Spectroscopic ellipsometry (SE) has provided film thicknesses, optical constants, and roughnesses. Atomic force microscopy (AFM) has provided more direct measures of film roughnesses and thicknesses. Scanning electron microscopy (SEM), transmission electron microscopy (TEM), and helium ion microscopy (HIM) have been invaluable for surface imaging. Rutherford backscattering (RBS) has provided bulk (ca. 1 micron) views of our materials. X-ray diffraction has shown their crystal structures. The combination of the results from these techniques has allowed us to develop a reasonable understanding of our materials.