Course Information
Course Title: Accessories and Techniques for FT-IR Sample Analysis
Categories: 1 - Microscopy
2 - Sample Preparation
3 - Spectroscopy
4 - Infrared Spectroscopy
Instructor(s): Richard Larsen Course Number: 77
Affiliation: Jasco, Inc.
Course Date: 03/10/2012 - Saturday Course Length: 1 Day Course
Start Time: 08:30 AM End Time: 05:00 PM
Fee: $455 ($655 after 2/13/12) Textbook Fee:

Course Description
This intensive 1-day workshop will introduce infrared spectroscopy, outline the various sample handling methods and provide guidance on the numerous transmission and reflectance methods available for infrared analysis. Workshop lectures will introduce Fourier Transform Infrared (FT-IR) spectroscopy, the advantages of FT-IR spectroscopy, discuss FT-IR sample analysis methods and the accessories used to obtain representative infrared spectra of analytical samples. A discussion of simple methods for evaluating instrument and accessory performance will also be offered. Methods for obtaining the 'ideal' spectrum and how to get the most out of the large variety of available FT-IR sampling accessories will be reviewed in addition to the common pitfalls to avoid during sample preparation and spectral interpretation of the results. Sampling techniques for transmission measurements using KBr pellets, mulls, liquid cells and films will be outlined in addition to presentations on FT-IR Microscopy, Photoacoustic (PAS), Multiple Internal Reflectance (MIR, HATR), Diffuse Reflectance (DRIFTS), Specular Reflectance, Reflection-Absorption Spectroscopy (RAIRS) and Grazing Angle measurements. The various transmission and reflectance measurement experiments will be examined to determine which method, or accessory, can provide the infrared data required of specific samples. The benefits and limitations of the FT-IR sampling methods, library Search procedures and data manipulation methods will also be explored. Hands-on exercises will allow workshop attendees to use various reflectance sampling accessories to collect data from representative analytical samples. This workshop is intended for those either just beginning infrared analysis or for participants interested in more advanced methods of infrared sample analysis.

Target Audience
Chemists and laboratory technicians that require more familiarity with modern FT-IR analysis, the methods and accessories used to collect data from the instrumentation. The course is intended as an interactive discussion on the various sampling methods, data processing commands and spectral library search procedures used in modern FT-IR analysis.

Course Outline
Theory of infrared spectroscopy; FT-IR instrumentation; Transmission Techniques; Search and Data Manipulation Procedures; Photoacoustic and Reflectance Accessories; FT-IR Microscopy; Hands-on Exercises 

Course Instructor's Biography
Richard A. Larsen is currently employed as the Spectroscopy Products Manager for Jasco, Inc., supplying applications, marketing and sales support for all spectroscopy products of Jasco, Inc. including FT-IR, FT-Raman, Raman, UV-Vis, Fluorescence, Near-Field, Polarimetry and Circular Dichroism instrumentation. He has conducted numerous instrumentation, software and applications training courses including roles as an instructor and guest lecturer at annual events such as the Fisk Infrared Institute, the Bowdoin College Infrared course, the Molecular Microspectroscopy Workshop of Miami University (Ohio) and various workshops at PittCon, EAS, FACSS and ACS conferences. He was formerly employed by The Perkin Elmer Corporation as a Technical Specialist and a Senior Infrared Product Specialist for FT-IR and FT-Raman products. He has also worked as an applications consultant for Mattson Instruments, Thermo Scientific and Jasco, Inc. He received a dual B.S. in Chemistry and Computer Science from the South Dakota School of Mines and Technology, obtaining his Ph.D. in Physical Chemistry from the University of South Carolina.