Short Course Listings
Short Course

Course Information
Course Title: Practical Handheld (HH) XRF, pXRF in the Workplace
Categories: 1 - Analytical Metrology
2 - Environmental Analysis
3 - Spectroscopy
4 - Teaching Analytical Chemistry
5 - X-Ray Spectrometry
Instructor(s): Alexander Seyfarth Course Number: 91
Affiliation: Bruker Elemental
Course Date: 03/20/2013 - Wednesday Course Length: 1/2 Day Course
Start Time: 08:30 AM End Time: 12:30 PM
Fee: $260 ($360 after 2/18/13) Textbook Fee:

Course Description
Got a HH XRF "gun“? Not fully clear on how to use and what it can do? Do you want to understand the underlying technology in lay-man/lay-woman terms? Understanding the technology and its limitations will enable you to produce better data and be more efficient! Regardless of VENDOR system this course will teach you what it takes to understand what and how you are analyzing your samples! While the use of HH XRF for alloy analysis or Positive Material Identification is generally straightforward it get’s more complicated when trying to analyze soil, mining materials and especially for consumer goods screening. How about non generic applications such as food contaminants, cosmetics , textiles etc.? Want to be able to do CSI type elemental investigation of any sample? Learn what you can do using qualitative analysis of the measured spectrum! The ultimate proof is always the spectrum! We will teach Your hands on identification techniques! What questions and performance needs to be checked prior to purchase. Use the knowledge directly at the show! Are you buying or upgrading from an older unit? Learn what to compare for Your application. Bring your samples and see for yourself during the show from all vendors what the newest HH XRF can do!

Target Audience
New and existing users of HH XRF instrumentation Training intended as refresher and initial training for users to use HH XRF safely and be aware of the implications of using X-Rays for sample analysis. Ties in with HH XRF safety course from the morning

Course Outline
• Short Recap on Safety and Basic Theory (1h)
• What am I measuring ( the Analyzed layer) and its
implication to your sampling
• What does LLD, LOD, LOQ etc. stand for and how it applies to
YOUR application
• Examples of Application groups
o Alloy and PMI analysis
o Soil analysis
o Geochemical Analysis and Mining Samples
o Consumer Goods/Restricted Materials
o Layer analysis
o Forensics and Generic Qualitative Analysis
• The spectral fingerprint and comparing fact and fiction!
• Conclusion

Course Instructor's Biography
Alexander Seyfarth received his Master Degree in Mineralogy (specialized in analytical Geochemistry and Crystallography) from Giessen University. From 1996 onward he worked as XRF and XRD application scientist for Siemens and then Bruker and performed many commissioning and installations in the cement, mining and petro chemical market segments. From 2006 he became the Product Manager XRF and Manager of the Laboratories for Bruker AXS Laboratory XRF in North America.2011 saw him as Sr. Application Scientist for Thermo Scientific specialized in the Hybrid XRF&XRD units. Since June 2012 he is working as the global Product Manager and Application team leader for Bruker Elemental. He is engaged in as part of the faculty of the XRF short course at the UNIVERSITY OF WESTERN ONTARIO (London, ONT) since 2005 and actively promotes teaching XRF in small seminars throughout the US and Canada.