Short Course Listings
Short Course

Course Information
Course Title: Problems with FT-IR Spectra and How to Avoid Them
Categories: 1 - Spectroscopy
2 - Infrared Spectroscopy
Instructor(s): Ellen Miseo / Jenni Briggs Course Number: 63
Affiliation: Hamamatsu
Course Date: 03/09/2016 - Wednesday Course Length: 1/2 Day Course
Start Time: 08:30 AM End Time: 12:30 PM
Fee: $300 ($400 after 2/12/16) Textbook Fee:

Course Description
A huge number of users of FT-IR spectrometers have received little or no formal training in spectroscopy and therefore cannot distinguish between “good” and “bad” spectra. In this course, we will show many of the problems that are commonly encountered with FT-IR spectra measured by inexperienced (and often experienced!) users and show how to avoid them. Problems can appear from the instrument, the sample accessory and/or presentation. Since the bulk of the samples that are currently analyzed are done by Attenuated Total Reflection we will cover it in detail. We will also address common problems associated with other accessories. This course will address these issues and how to compensate or fix them.

Target Audience
This course is designed for scientists and engineers running infrared spectra who want to understand what constitutes a good spectrum and how to achieve that using a variety of sampling techniques. It is particularly aimed at those students who are not familiar with all the sampling techniques available and how they impact the quality of the spectrum.

Course Outline
Reflection spectroscopy including ATR, Diffuse Reflection and Reflection Absorption
• the effect of poor contact on internal reflection elements
• not fully covering the beam in an internal reflection element
• band distortions from all types of reflection spectra
• the effect of front surface reflection on diffuse reflection spectra
Measurement Effects
• spectral shifts introduced on vignetting (changing the beam diameter or shape)
• the effect of resolution on interpretation and spectral searching
• the effect of apodization
• effect of detector saturation
• effect of temperature changes of the instrument
• assigning a structure based on the first hit of a spectral search
Transmission spectroscopy
• the effect of scattering, excessively thick samples, temperature changes and air bubbles on solution spectra
• effect of refractive index of window material
• the effect of atmospheric water vapor and carbon dioxide
• interference fringes
• effect of dilution, especially for hydrogen-bonded molecules
• artifacts seen on spectral subtraction
• band distortions encountered during the measurement of polymer fibers
We will also address typical contaminants found in infrared spectroscopy.

Course Instructor's Biography
The course will be team taught by Ellen Miseo and Jenni Briggs. Both are practicing spectroscopists in industry and have had hands-on practical experience with the material under discussion. Ellen Miseo has practiced infrared spectroscopy for her entire career. Her primary interest is in infrared microscopy and infrared imaging and she has developed new instrumentation, commercialized new techniques and anticipated new trends in the industry. Her accomplishments include development of equipment as well as foreseeing customer trends and adapting to them. Dr. Miseo is President (2016) of the Society for Applied Spectroscopy and a member of the Coblentz Society and the American Chemical Society Jenni Briggs is the Senior Applications Engineer at Pike Technologies, a supplier of infrared, Raman and UV/Vis accessories. Jenni spends her time discussing spectroscopic techniques with a diverse set of instrument users.