Short Course Listings
 
Short Course

Course Information
Course Title: Nanocrystallite and Nanoparticle Size Analysis with an X-Ray Diffractometer
Categories: 1 - Data Analysis
2 - Nanoscience
3 - X-Ray Diffraction
Instructor(s): Scott Speakman Course Number: 135
Affiliation: PANalytical
Course Date: 03/10/2016 - Thursday Course Length: 1 Day Course
Start Time: 08:30 AM End Time: 05:00 PM
Fee: $550 ($750 after 2/12/16) Textbook Fee:

Course Description
X-ray diffraction and small angle X-ray scattering (SAXS) are complementary techniques that can provide information about nanocrystallite size and nanoparticle size, respectively. Both techniques can be supported on a single modern X-ray diffractometer, making it easy to utilize the complementary nature of these techniques for the characterization of increasingly complex nanosystems. This 1-day course will introduce newcomers to the important aspects of data collection and analysis for X-ray diffraction and SAXS. The techniques discussed will also be useful to experience diffractionists looking to move beyond the simple Scherrer equation to more complex line profile analysis of nanocrystallite size and microstrain.

Target Audience
Relative newcomers to X-ray diffraction and scattering including laboratory personnel, scientists, and graduate students. This course will also be useful to practitioners who have currently use simple calculations, such as the Scherrer equation or Guinier analysis, because more sophisticated modeling and analytical techniques will be discussed.

Course Outline
1) Introduction- the difference between crystallites, particles, domains, grains and agglomerates.
2) Theory of X-ray diffraction line broadening for crystallite size and microstrain analysis
3) How to collect good data for X-ray diffraction line profile analysis
4) Data analysis using profile fitting and Rietveld refinement for Scherrer analysis and Williamson-Hall analysis.
5) Theory of small angle X-ray scattering (SAXS)
6) How to collect good data for SAXS analysis
7) Analysis of SAXS data using Guinier analysis, Porod analysis, and sophisticated model refinement.
8) Complementary techniques such as dynamic light scattering and electron microscopy

Course Instructor's Biography
Scott Speakman is a Principal Scientist at PANalytical, Inc. Prior to joining PANalytical, Scott Speakman spent over 11 years working in user-oriented X-ray diffraction facilities at Oak Ridge National Lab and MIT. Scott is a Fellow of the International Center for Diffraction Data and is chair of the subcommittee on Micro and Meso Materials. Mike Hawkridge and Anasuya Adibhatla, Application Specialists at PANalytical, will contribute with their expertise on SAXS, diffraction and complementary methods. Mike Hawkridge was previously a research assistant professor at the University of Arkansas. Anu Adibhatla joined PANalytical after receiving her PhD from the University of Nevada Reno. Alan Rawle, Applications Manager for Malvern Instruments, will contribute his expertise on SAXS and the complementary technique of dynamic light scattering. Alan Rawle is active in international standardization working with ISO (TC 24/SC4 Particle Characterization) and ASTM (E56.02 CoChair Characterization Subcommittee of E56 Committee on Nanotechnology).