Short Course Listings
Short Course

Course Information
Course Title: Applications of Two-Dimensional X-ray Diffraction
Categories: 1 - Laboratory Information and Management
2 - Atomic Spectrometry-Spectroscopy
3 - Polymers
4 - Forensics
5 - Homeland Defense
6 - X-Ray Diffraction
Instructor(s): Bob He Course Number: 37
Affiliation: Bruker AXS
Course Date: 03/09/2016 - Wednesday Course Length: 1/2 Day Course
Start Time: 08:30 AM End Time: 12:30 PM
Fee: $300 ($400 after 2/12/16) Textbook Fee: $120

Course Description
X-ray diffraction can characterize materials of all kinds, such as metals, polymers, ceramics, semiconductors, thin films, biomaterials and composites. The advance in two-dimensional X-ray detectors has further enhanced the applications of XRD. Two-dimensional diffraction pattern contains abundant information about the atomic arrangement, microstructure and defects of a solid or liquid material. This short course covers the basic concept and typical applications, such as phase identification, texture, stress, microstructure analysis, crystallinity, crystal size, thin film analysis and combinatorial screening. Experimental examples in materials research, pharmaceuticals, and forensics are also given.

Target Audience
The course is addressed to the existing and potential X-ray diffractometer users and lab managers who are interested in the general concept and applications of two-dimensional X-ray diffraction. Some experience in XRD is helpful, but participants of all levels can benefit from the basic concept and application examples of 2D XRD in various fields.

Course Outline
- Basic concept of X-ray diffraction
- Two-dimensional X-ray diffraction instrumentation
- Phase identification
- Stress measurement
- Texture analysis
- Thin film analysis
- Micro-diffraction
- XRD combinatorial screening
- Forensics and archaeology

Course Instructor's Biography
Bob He, Director of Innovation and Business Development at Bruker AXS, is recognized as one of the pioneers in two-dimensional X-ray diffraction. He earned his Ph.D. in Materials Science from Virginia Tech in 1992 and worked on X-ray diffractometer and methods development since 1986. Dr. He has delivered many presentations as invited speaker, plenary speaker, and workshops instructor on two-dimensional X-ray diffraction at universities, conferences, national labs and industrial technical centers. He has obtained sixteen U.S. patents and two R&D 100 Awards for the related instruments, and published over thirty papers and a textbook on two-dimensional x-ray diffraction. He is a fellow member of International Center of Diffraction Data.