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Short Course

Course Information
Course Title: X-ray Analysis for Metallurgical Challenges
Categories: 1 - Data Analysis
2 - Surface Analysis
3 - X-Ray Diffraction
4 - X-Ray Spectrometry
Instructor(s): Scott Speakman Course Number: 141
Affiliation: PANalytical
Course Date: 03/08/2017 - Wednesday Course Length: 1/2 Day Course
Start Time: 08:30 AM End Time: 12:30 PM
Fee: $325 ($425 after 2/18/17) Textbook Fee:

Course Description
New metal processing techniques, such as additive manufacturing and friction stir welding, pose new challenges to traditional X-ray analysis. This workshop will review traditional applications of X-ray analysis for metals and will then discuss how these techniques may be adapted for to address the challenges of modern metallurgy. X-rays have been used to analyze metals for over 100 years, particularly following the first powder diffraction measurements of metals by Albert Hull in 1916. Since then, X-ray diffraction and fluorescence have evolved into essential tools for metallurgical analysis. X-ray fluorescence (XRF) is an essential tool for raw materials analysis, process control samples, scrap sorting, and quality control of final metal products. Latest developments in XRF resulted in a new analytical approach that combines wavelength dispersive (WD) and energy dispersive (ED) technologies in one platform with the ultimate benefits of delivering substantial analysis time reduction or improved performance. Such new technology allows also for practical small spot analysis and mapping, particularly well suited for the large grains and potentially inhomogeneous products made by additive manufacturing and friction stir welding. X-ray diffraction (XRD) is an established tool for phase analysis (such as retained austenite), texture and stress quantification that are helpful in life cycle prediction and engineering design. New technology for 2D diffraction and hard radiation are necessary for addressing the large grain size that compromise data quality from additive manufacturing. This workshop will provide brief background introduction to these traditional techniques, and then discuss examples of their application to modern challenges. Though focused on metallurgical analysis, the techniques discussed are applicable to a wide variety of material analysis challenges and may be of interest to researchers in building materials and coating analysis.

Target Audience
This course is targeted to researchers with a wide variety of experience levels working with metal analysis. Basic introduction will be provided for attendees that have never used X-ray analysis before. Advanced discussions should be informative and engaging for experienced analysts.

Course Outline
1. Introduction-- why new metallurgical processees, such as additive manufacturing, pose analytical challenges

2. Introduction to X-ray Diffraction for Stress and Texture Analysis

3. New Technologies and Methods for X-ray Diffraction Analysis of Challenging Metals

4. Introduction to X-ray Fluorescence

5. New Technnologies and Methods for X-ray Fluorescence Analysis of Challenging Metals

Course Instructor's Biography
Dr. Scott Speakman joined PANalytical as Principal Scientist for X-ray Diffraction in 2014. Prior to joining PANalytical, he managed the X-ray Shared Experimental Facility at MIT for 8 years. Dr. Speakman is a Fellow of the International Center for Diffraction Data, the chairperson for the ICDD subcommittee on Micro- and Meso-Porous Materials, and was awarded a 2013 Infinite Mile Award for extraordinary service to MIT. Dr. Micalea is Global Product Manager for Metals at PANalytical. Prior to joining PANalytical, she was a researcher on the geochemistry of mantle minerals at the University of Padova.