Short Course Listings
 
Short Course

Course Information
Course Title: Basics and Applications of Modern Methods of Particle Sizing and Characterization
Categories: 1 - Particle Characterization
Instructor(s): Remi Trottier Course Number: 112
Affiliation: Dow Chemical
Course Date: 03/08/2017 - Wednesday Course Length: 2 Day Course
Start Time: 08:30 AM End Time: 05:00 PM
Course Date 2: 03/09/2017 - Thursday    
Start Time: 08:30 AM End Time: 05:00 PM
Fee: $1100 ($1500 after 2/18/17) Textbook Fee:

Course Description
Given the complexity, and diversity of modern instruments for particle characterization, choosing the best technology for a particular application, and using it effectively, is not a trivial task. We have assembled a faculty of seasoned experts in the field of particle characterization that will provide a comprehensive review of the various methods and techniques. This short course will cover the basics of particle size (from nanoscale to millimeters) measurement, analysis and characterization, along with the latest commercially available technologies. The importance of proper sampling and sample dispersion - which are commonly overlooked - will be covered. Statistical data such as averages and distribution types, which are commonly misunderstood, will also be covered. Commercially available instruments, including the strength and weaknesses of each technology, along with practical examples, will be presented. Participants will acquire the knowledge necessary for proper instrument selection and data validation and interpretation.

Target Audience
Managers, scientists, engineers, and technologists who are involved in the selection and purchasing of instrumentation, developing analytical methods, interpreting particle size data, or making decisions based on such data will find this course invaluable. This course is designed to benefit both the neophyte and experienced practitioner.

Course Outline
• Basic concepts and theory
Data Representation
 Number, Surface Area, Volume Distributions
 Averages
Sampling
Zeta Potential and Dispersion Stability
Formulating Stable Dispersions and Emulsions
• Latest commercially available technologies for determining liquid- borne and airborne particle size, shape, and concentration
Laser Diffraction
Sedimentation & Centrifugation Methods
Dynamic Image Analysis
Dynamic Light Scattering
Optical Particle Counting
 SPOS
Electrozone Particle Counters
Ultrasonic Spectroscopy
Field Flow Fractionation of Particles
Column Chromatographic Methods of Particle Size Analysis
Nuclear Magnetic Resonance Relaxation and Diffusion
• Evaluating instrument performance, data interpretation, data and methodology validation, and technology selection

Course Instructor's Biography
Dr. Trottier is a research scientist in the Solids Processing Discipline of Engineering Sciences at The Dow Chemical Company. He has over 20 years of industrial experience in particle characterization, aerosol science, air filtration and solids processing technology. Dr. Trottier has authored some 20 papers and has served as an instructor for several short courses on particle characterization. Prior to joining Dow, Dr. Trottier was a senior scientist in the physical measurement group within the Analytical Chemistry Division at the Alcoa Technical Center. He supervised the particle characterization laboratory where he developed several particle characterization methods. Dr. Trottier received his B.Sc. (1983) and M.Sc. (1987) degrees in Applied Physics from Laurentian University in Canada, and his Ph.D. (1996) in Chemical Engineering from Loughborough University of Technology in the UK. During the course of his education, Remi received most of his formal training in particulate technology from Dr. Brian Kaye, who was one of the most renowned authorities in this field of particle technology.