Short Course Listings
Short Course

Course Information
Course Title: (CANCELED) Overview of Materials Characterization Techniques
Categories: 1 - Analytical Metrology
2 - Atomic Force Microscopy
3 - Microscopy
4 - Nanoscience
5 - Polymers
6 - Surface Analysis
Instructor(s): Dalia Yablon / Greg Haugstad, Greg Haugstad Course Number: 53
Affiliation: Dr. / Univ Minnesota
Course Date: 03/07/2017 - Tuesday Course Length: 2 Day Course
Start Time: 08:30 AM End Time: 05:00 PM
Course Date 2: 03/08/2017 - Wednesday    
Start Time: 08:30 AM End Time: 05:00 PM
Fee: $1100 ($1500 after 2/18/17) Textbook Fee:

Course Description
This two-day course will cover an overview of materials characterization methods to probe a wide variety of properties with an emphasis on real-world applications in industries including biomedical, pharmaceutical, chemicals, personal care, semiconductor, coatings, and energy. We explore capabilities to measure material properties such as morphology, elemental information, chemical information, and mechanical/electrical properties. The methods covered in this course provide information on the micro through nanoscale; see outline below for a listing of the capabilities covered. Overall the course will compare and contrast differences in capabilities, sample preparation required, and information provided from all these methods. For each technique, an overview of each method will be presented explaining basics of operation, followed by applications of these techniques in various industries. The purpose is to provide attendees with a basic landscape of what capabilities are possible and how to use them to solve practical real-world problems. For example, in the biomed/pharma industry, characterization methods to elucidate both surface and internal morphology and composition will be exemplified in the areas of medical device technology and drug delivery.

Target Audience
This course is intended for an academic and industrial audience from advanced undergraduates to seasoned professionals who seek an introduction to these important and popular methods, their capabilities, and how they can be applied to addressing real-world problems.

Course Outline
1. Elemental information: X-ray photoelectron spectroscopy (XPS)
2. Electron-based methods: overview of SEM and TEM
3. Crystallography and structure: x-ray diffraction (XRD)
4. Chemical analysis: Nanoscale vibrational spectroscopic (Raman and IR) measurements
5. Mechanical properties: Nanoindentation
6. Surface morphology and mechanical properties: Scanning probe microscopy/atomic force microscopy (SPM/AFM)
7. Electrostatic properties of materials

Course Instructor's Biography
Dalia Yablon holds an A.B. in Chemistry from Harvard University and a Ph.D. in Physical Chemistry from Columbia University. She spent 11 years at ExxonMobil Research and Engineering’s Corporate Strategic Research, its flagship research center in Annandale NJ. At ExxonMobil, she served as Program Leader in various sectors of the energy business and developed a state of the art scanning probe microscopy/nanoindentation laboratory for nanoscale characterization of surfaces and interfaces. She has worked in a number of cross-sector areas including polymers, tribology, lubrication, corrosion and unconventional gas resources with a specific focus on developing new nanomechanical characterization methods. In 2013, Dalia founded a scientific consulting company in the greater Boston area, SurfaceChar, a surfaces and interfaces characterization, measurement, and educational/training consulting service with a focus on scanning probe microscopy/atomic force microscopy. Greg Haugstad is technical staff member and director of the Characterization Facility (“CharFac”), a core facility at the University of Minnesota. Dr. Haugstad received his B.A. in physics from Gustavus Adolphus College and Ph.D. in physics from the University of Minnesota. After postdoctoral research with DuPont in the University’s NSF Center for Interfacial Engineering, he joined the CharFac in 1994. In this role his technique focus includes atomic force microscopy (AFM), ion beam analysis (Rutherford backscattering and related) and time-of-flight secondary ion mass spectrometry. He is also a member of the graduate faculty, serving as thesis co-adviser within the materials science and chemistry programs.